Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
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SN74ABT18640DLR | SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS | Texas-Instruments | DL | 56 | -40°C | 85°C | 400 K |
SN74ABT18640DLR | SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS | Texas-Instruments | DL | 56 | -40°C | 85°C | 400 K |
SN74ABT18646PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 145 K |
SN74ABT18646PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 145 K |
SN74ABT18646PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 145 K |
SN74ABT18652PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 169 K |
SN74ABT18652PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 169 K |
SN74ABT8245DW | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | DW | 24 | -40°C | 85°C | 342 K |
SN74ABT8245DWR | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | DW | 24 | -40°C | 85°C | 342 K |
SN74ABT8543DL | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS | Texas-Instruments | DL | 28 | -40°C | 85°C | 357 K |
SN74ABT8543DLR | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS | Texas-Instruments | DL | 28 | -40°C | 85°C | 357 K |
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