| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| 74ABT125CSC | Quad Buffer with 3-STATE Outputs | Fairchild-Semiconductor | SOIC | 14 | - | - | 69 K |
| 74ABT125CSCX | Quad Buffer with 3-STATE Outputs | Fairchild-Semiconductor | SOIC | 14 | - | - | 69 K |
| SN74ABT18640DL | SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS | Texas-Instruments | DL | 56 | -40°C | 85°C | 400 K |
| SN74ABT18640DLR | SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS | Texas-Instruments | DL | 56 | -40°C | 85°C | 400 K |
| SN74ABT18640DLR | SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS | Texas-Instruments | DL | 56 | -40°C | 85°C | 400 K |
| SN74ABT18646PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 145 K |
| SN74ABT18646PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 145 K |
| SN74ABT18646PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 145 K |
| SN74ABT18652PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 169 K |
| SN74ABT18652PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 169 K |
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