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Electronic component:Description:Manuf.PackagePinsT°minT°maxDatasheet
AD664SD-BIP0-7.0V; 1000mW; monolithic 12-bit quad DAC. For automatic test equipment, robotics, process controlAnalog-DevicesDIP280°C70°C551 K
AD664SD-UNI0-7.0V; 1000mW; monolithic 12-bit quad DAC. For automatic test equipment, robotics, process controlAnalog-DevicesDIP280°C70°C551 K
AD664TD-BIP0-7.0V; 1000mW; monolithic 12-bit quad DAC. For automatic test equipment, robotics, process controlAnalog-DevicesDIP280°C70°C551 K
AD664TD-UNI0-7.0V; 1000mW; monolithic 12-bit quad DAC. For automatic test equipment, robotics, process controlAnalog-DevicesDIP280°C70°C551 K
AD667AD0-18V; 1000mW; microprocessor-compatible 12-bit D/A converter. For automatic test equipment, robotics, process controlAnalog-DevicesDIP280°C70°C327 K
AD667BD0-18V; 1000mW; microprocessor-compatible 12-bit D/A converter. For automatic test equipment, robotics, process controlAnalog-DevicesDIP28-25°C85°C327 K
AD667JN0-18V; 1000mW; microprocessor-compatible 12-bit D/A converter. For automatic test equipment, robotics, process controlAnalog-DevicesDIP280°C70°C327 K
AD667JP0-18V; 1000mW; microprocessor-compatible 12-bit D/A converter. For automatic test equipment, robotics, process controlAnalog-DevicesPLCC280°C70°C327 K
AD667KP0-18V; 1000mW; microprocessor-compatible 12-bit D/A converter. For automatic test equipment, robotics, process controlAnalog-DevicesPLCC280°C70°C327 K
AD667SD0-18V; 1000mW; microprocessor-compatible 12-bit D/A converter. For automatic test equipment, robotics, process controlAnalog-DevicesDIP28-25°C85°C327 K
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