Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
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SN74BCT8373ANT | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES | Texas-Instruments | NT | 24 | 0°C | 70°C | 294 K |
SN74BCT8374ADW | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
SN74BCT8374ADWR | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
SN74BCT8374ADWR | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
SN74BCT8374ANT | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | NT | 24 | 0°C | 70°C | 294 K |
SN74BCT8374ANT | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | NT | 24 | 0°C | 70°C | 294 K |
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