| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| Bt8370EPF | Fully integrated T1/E1 framer and line interface | distributor | MQFP | 80 | -40°C | 85°C | 3 M |
| Bt8370KPF | Fully integrated T1/E1 framer and line interface | distributor | MQFP | 80 | 0°C | 70°C | 3 M |
| Bt8375EPF | Fully integrated T1/E1 framer and line interface | distributor | MQFP | 80 | -40°C | 85°C | 3 M |
| Bt8375KPF | Fully integrated T1/E1 framer and line interface | distributor | MQFP | 80 | 0°C | 70°C | 3 M |
| Bt8376EPF | Fully integrated T1/E1 framer and line interface | distributor | MQFP | 80 | -40°C | 85°C | 3 M |
| Bt8376KPF | Fully integrated T1/E1 framer and line interface | distributor | MQFP | 80 | 0°C | 70°C | 3 M |
| SN74BCT8374ADWR | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
| SN74BCT8374ADWR | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
| SN74BCT8374ANT | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | NT | 24 | 0°C | 70°C | 294 K |
| SN74BCT8374ANT | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | NT | 24 | 0°C | 70°C | 294 K |
| VT8371 | KX133 AMD Athlon north bridge | distributor | BGA | 516 | 0°C | 55°C | 147 K |
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