| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| ESM2012DV | NPN DARLINGTON POWER MODULE | SGS-Thomson-Microelectronics | - | - | - | - | 117 K |
| MC100EL12DR2 | Low Impedance Driver | ON-Semiconductor | SOIC | 8 | - | - | 73 K |
| MC100LVEL12DR2 | Low Voltage Low Impedance Driver | ON-Semiconductor | SOIC | 8 | - | - | 52 K |
| MC10EL12DR2 | Low Impedance Driver | ON-Semiconductor | SOIC | 8 | - | - | 73 K |
| MUN5112DW1T1 | Dual Bias Resistor Transistor PNP | ON-Semiconductor | - | 6 | - | - | 216 K |
| MUN5212DW1T1 | Dual Bias Resistor Transistor NPN | ON-Semiconductor | - | 6 | - | - | 179 K |
| MUN5312DW1T1 | Dual Bias Resistor Transistor NPN/PNP | ON-Semiconductor | - | 6 | - | - | 308 K |
| MUN5312DW1T3 | Dual Bias Resistor Transistor NPN/PNP | ON-Semiconductor | - | 6 | - | - | 308 K |
| SN74LVTH182512DGGR | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | DGG | 64 | -40°C | 85°C | 518 K |
| SN74LVTH18512DGGR | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | DGG | 64 | -40°C | 85°C | 518 K |
| [1] [2] [3] [4] [5] 6 [7] [8] [9] [10] |
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