| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| 2SA1825 | PNP epitaxial planar silicon transistor,50V/8A switching application | SANYO-Electric-Co--Ltd- | 2084 | 3 | - | - | 131 K |
| 2SD1825 | NPN epitaxial planar silicon transistor, driver application | SANYO-Electric-Co--Ltd- | 2041A | 3 | - | - | 127 K |
| HS-1825ARH | Radiation Hardened High-Speed, Dual Output PWM | Intersil-Corporation | - | - | - | - | 35 K |
| LB1825 | 3-phase brushless motor driver | SANYO-Electric-Co--Ltd- | DIP28H | 28 | -20°C | 80°C | 140 K |
| SN74ABTH182504APM | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 547 K |
| SN74ABTH182504APM | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 547 K |
| SN74ABTH182504APM | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 547 K |
| SN74LVTH182502APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 478 K |
| SN74LVTH182504APM | 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 544 K |
| SN74LVTH182504APM | 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 544 K |
| SN74LVTH182512DGGR | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | DGG | 64 | -40°C | 85°C | 518 K |
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