| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| CXA2504N | Sample-and-Hold Driver IC for LCD | Sony-Semiconductor | - | - | - | - | 212 K |
| JM38510/32504B2A | OCTAL D-TYPE FLIP-FLOPS WITH ENABLE | Texas-Instruments | FK | 20 | -55°C | 125°C | 180 K |
| JM38510/32504BRA | OCTAL D-TYPE FLIP-FLOPS WITH ENABLE | Texas-Instruments | J | 20 | -55°C | 125°C | 180 K |
| SN74ABTH182504APM | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 547 K |
| SN74ABTH182504APM | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 547 K |
| SN74ABTH182504APM | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 547 K |
| SN74LVTH182504APM | 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 544 K |
| SN74LVTH182504APM | 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 544 K |
| X25040P | 4K (512 x 8bit) SPI serial E2PROM with block lock protection | distributor | DIP8P | 8 | 0°C | 70°C | 61 K |
| X25040P-3 | 4K (512 x 8bit) SPI serial E2PROM with block lock protection | distributor | DIP8P | 8 | 0°C | 70°C | 61 K |
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