| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| 74F162APC | Synchronous Presettable BCD Decade Counter (Synchronous Reset) | Fairchild-Semiconductor | MDIP | 16 | - | - | 72 K |
| HA17082APS | J-FET dual operational amplifiers | distributor | DIP | 8 | -20°C | 75°C | 54 K |
| IDT29FCT52APB | Fast CMOS octal registered transceivers | Integrated-Device-Technology-Inc- | PDIP | - | -55°C | 125°C | 62 K |
| KIA7812API | 12V, 1A three-terminal positive voltage regulator | Korea-Electronics-Co--Ltd- | - | 3 | -30°C | 150°C | 382 K |
| SN74LVTH182502APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 478 K |
| SN74LVTH182652APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 561 K |
| SN74LVTH18502APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 478 K |
| SN74LVTH18502APMR | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 478 K |
| SN74LVTH18652APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 561 K |
| UAF42AP-1 | Universal Active Filter | Burr-Brown-Corporation | 14 | - | -25°C | 85°C | 149 K |
| [1] [2] [3] [4] 5 [6] [7] [8] [9] [10] |
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