| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| SN74BCT8373ADW | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
| SN74LVC373APWLE | OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS | Texas-Instruments | PW | 20 | -40°C | 85°C | 127 K |
| SN74LVC373APWR | OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS | Texas-Instruments | PW | 20 | -40°C | 85°C | 127 K |
| SN74LVCH16373ADGGR | 16-BIT TRANSPARENT D-TYPE LATCH WITH 3-STATE OUTPUTS | Texas-Instruments | DGG | 48 | -40°C | 85°C | 141 K |
| SN74LVCH16373ADGVR | 16-BIT TRANSPARENT D-TYPE LATCH WITH 3-STATE OUTPUTS | Texas-Instruments | DGV | 48 | -40°C | 85°C | 141 K |
| SN74LVCH16373ADL | 16-BIT TRANSPARENT D-TYPE LATCH WITH 3-STATE OUTPUTS | Texas-Instruments | DL | 48 | -40°C | 85°C | 141 K |
| SN74LVCH16373ADLR | 16-BIT TRANSPARENT D-TYPE LATCH WITH 3-STATE OUTPUTS | Texas-Instruments | DL | 48 | -40°C | 85°C | 141 K |
| SN74LVCH32373AGKER | 32-BIT TRANSPARENT D-TYPE LATCH WITH 3-STATE OUTPUTS | Texas-Instruments | GKE | 96 | -40°C | 85°C | 130 K |
| SNJ54BCT8373AFK | SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES | Texas-Instruments | FK | 28 | -55°C | 125°C | 294 K |
| SNJ54BCT8373AJT | SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES | Texas-Instruments | JT | 24 | -55°C | 125°C | 294 K |
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