| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| NE5534AFE | Dual Low Noise Operational Amplifier | Philips-Semiconductors | SOT151 | - | - | - | 109 K |
| SE5534AFE | Dual Low Noise Operational Amplifier | Philips-Semiconductors | SOT151 | - | - | - | 109 K |
| SNJ54ALS374AFK | OCTAL D-TYPE EDGE TRIGGERED FLIP-FLOPS WITH 3-STATE OUTPUTS | Texas-Instruments | FK | 20 | -55°C | 125°C | 125 K |
| SNJ54ALS74AFK | DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET | Texas-Instruments | FK | 20 | -55°C | 125°C | 114 K |
| SNJ54ALS74AFK | DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET | Texas-Instruments | FK | 20 | -55°C | 125°C | 114 K |
| SNJ54ALS74AFK | DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET | Texas-Instruments | FK | 20 | -55°C | 125°C | 114 K |
| SNJ54AS74AFK | DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET | Texas-Instruments | FK | 20 | -55°C | 125°C | 114 K |
| SNJ54BCT8374AFK | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | FK | 28 | -55°C | 125°C | 294 K |
| SNJ54BCT8374AFK | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | FK | 28 | -55°C | 125°C | 294 K |
| SNJ54LVC574AFK | OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS | Texas-Instruments | FK | 20 | -55°C | 125°C | 142 K |
| SNJ54LVC574AFK | OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS | Texas-Instruments | FK | 20 | -55°C | 125°C | 142 K |
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