| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| CY7C43646AV-10AC | 3.3V SYNC X36 TRI BUS FIFO | Cypress-Semiconductor | - | - | - | - | 574 K |
| CY7C43646AV-15AC | 3.3V SYNC X36 TRI BUS FIFO | Cypress-Semiconductor | - | - | - | - | 574 K |
| CY7C43646AV-7AC | 3.3V SYNC X36 TRI BUS FIFO | Cypress-Semiconductor | - | - | - | - | 574 K |
| IDT54FCT646AE | Fast CMOS octal transceiver/register | Integrated-Device-Technology-Inc- | CERPACK | - | -55°C | 125°C | 91 K |
| IDT54FCT646AEB | Fast CMOS octal transceiver/register | Integrated-Device-Technology-Inc- | CERPACK | - | -55°C | 125°C | 91 K |
| IDT75FCT646AE | Fast CMOS octal transceiver/register | Integrated-Device-Technology-Inc- | CERPACK | - | 0°C | 70°C | 91 K |
| IDT75FCT646AE | Fast CMOS octal transceiver/register | Integrated-Device-Technology-Inc- | CERPACK | - | 0°C | 70°C | 91 K |
| IDT75FCT646AEB | Fast CMOS octal transceiver/register | Integrated-Device-Technology-Inc- | CERPACK | - | 0°C | 70°C | 91 K |
| SN74LVTH182646APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 551 K |
| SN74LVTH18646APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 551 K |
| << [3] [4] [5] [6] [7] 8 [9] [10] [11] [12] [13] >> |
|---|
