| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| MC74HC174AN | Hex D Flip-Flop with Common Clock and Reset | ON-Semiconductor | PDIP | 16 | - | - | 155 K |
| MC74HC374AN | Octal 3-State Non-Inverting D Flip-Flop | ON-Semiconductor | PDIP | 20 | - | - | 196 K |
| MC74HC574AN | Octal 3-State NonInverting D Flip-Flop | ON-Semiconductor | PDIP | 20 | - | - | 178 K |
| MC74HC74AN | Dual D Flip-Flop With Set and Reset | ON-Semiconductor | PDIP | 14 | - | - | 187 K |
| MC74HCT374AN | Octal 3-State NonInverting D Flip-Flop with LSTTL Compatible Inputs | ON-Semiconductor | PDIP | 20 | - | - | 185 K |
| MC74HCT574AN | Octal 3-State NonInverting D Flip-Flop with LSTTL-Compatible Inputs | ON-Semiconductor | PDIP | 20 | - | - | 162 K |
| MC74HCT74AN | Dual D Flip-Flop With Set and Reset with LSTTL Compatible Inputs | ON-Semiconductor | PDIP | 14 | - | - | 154 K |
| SN74BCT8374ANT | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | NT | 24 | 0°C | 70°C | 294 K |
| SN74BCT8374ANT | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | NT | 24 | 0°C | 70°C | 294 K |
| SN74LS74ANSR | DUAL D-TYPE POS.-EDGE-TRIGGERED FLIP-FLOPS WITH PRESET AND CLEAR | Texas-Instruments | NS | 14 | 0°C | 70°C | 268 K |
| SN74LS74ANSR | DUAL D-TYPE POS.-EDGE-TRIGGERED FLIP-FLOPS WITH PRESET AND CLEAR | Texas-Instruments | NS | 14 | 0°C | 70°C | 268 K |
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