| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| SN74ABT18245ADLR | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS | Texas-Instruments | DL | 56 | -40°C | 85°C | 357 K |
| SN74ABT8245DW | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | DW | 24 | -40°C | 85°C | 342 K |
| SN74ABT8245DWR | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | DW | 24 | -40°C | 85°C | 342 K |
| SN74BCT8240ADW | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL INVERTING BUFFERS | Texas-Instruments | DW | 24 | 0°C | 70°C | 293 K |
| SN74BCT8240ADWR | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL INVERTING BUFFERS | Texas-Instruments | DW | 24 | 0°C | 70°C | 293 K |
| SN74BCT8240ANT | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL INVERTING BUFFERS | Texas-Instruments | NT | 24 | 0°C | 70°C | 293 K |
| SN74BCT8244ADW | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUFFERS | Texas-Instruments | DW | 24 | 0°C | 70°C | 293 K |
| SN74BCT8244ADWR | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUFFERS | Texas-Instruments | DW | 24 | 0°C | 70°C | 293 K |
| SN74BCT8244ANT | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUFFERS | Texas-Instruments | NT | 24 | 0°C | 70°C | 293 K |
| SN74BCT8245ADW | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | DW | 24 | 0°C | 70°C | 309 K |
| [1] [2] [3] [4] 5 [6] [7] [8] [9] [10] |
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