Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
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CXP82400A | CMOS 8-bit Single Chip Microcomputer Piggyback/evaluator type | Sony-Semiconductor | - | - | - | - | 278 K |
MAZ8240 | Silicon planer type zener diode | Panasonic---Semiconductor-Company-of-Matsushita-Electronics-Corporation | - | - | - | - | 69 K |
SN74BCT8240ADW | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL INVERTING BUFFERS | Texas-Instruments | DW | 24 | 0°C | 70°C | 293 K |
SN74BCT8240ADWR | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL INVERTING BUFFERS | Texas-Instruments | DW | 24 | 0°C | 70°C | 293 K |
SN74BCT8240ANT | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL INVERTING BUFFERS | Texas-Instruments | NT | 24 | 0°C | 70°C | 293 K |
SNJ54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
SNJ54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
SNJ54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
SNJ54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
SNJ54BCT8240AJT | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | JT | 24 | -55°C | 125°C | 293 K |
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