| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| SN74ABTH182502APM | SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 549 K |
| SN74ABTH182504APM | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 547 K |
| SN74ABTH182504APM | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 547 K |
| SN74ABTH182504APM | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 547 K |
| SN74ALVCH16825DL | 18-BIT BUFFER/DRIVER WITH 3-STATE OUTPUTS | Texas-Instruments | DL | 56 | 0°C | 70°C | 112 K |
| SN74ALVCH16825DLR | 18-BIT BUFFER/DRIVER WITH 3-STATE OUTPUTS | Texas-Instruments | DL | 56 | 0°C | 70°C | 112 K |
| SN74ALVCH16825DLR | 18-BIT BUFFER/DRIVER WITH 3-STATE OUTPUTS | Texas-Instruments | DL | 56 | 0°C | 70°C | 112 K |
| SN74LVTH182502APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 478 K |
| SN74LVTH182504APM | 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 544 K |
| SN74LVTH182504APM | 3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 544 K |
| << [7] [8] [9] [10] [11] 12 [13] [14] [15] [16] [17] >> |
|---|
