Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
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SN74BCT8373ADW | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
SN74BCT8373ADWR | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
SN74BCT8373ANT | IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES | Texas-Instruments | NT | 24 | 0°C | 70°C | 294 K |
SN74BCT8374ADW | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
SN74BCT8374ADWR | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
SN74BCT8374ADWR | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
SN74SSTL16837ADGGR | 20-BIT SSTL_3 INTERFACE UNIVERSAL BUS DRIVER WITH 3-STATE OUTPUTS | Texas-Instruments | DGG | 64 | 0°C | 70°C | 93 K |
SN74SSTL16837ADGGR | 20-BIT SSTL_3 INTERFACE UNIVERSAL BUS DRIVER WITH 3-STATE OUTPUTS | Texas-Instruments | DGG | 64 | 0°C | 70°C | 93 K |
SNJ54BCT8373AFK | SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES | Texas-Instruments | FK | 28 | -55°C | 125°C | 294 K |
SNJ54BCT8373AJT | SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES | Texas-Instruments | JT | 24 | -55°C | 125°C | 294 K |
SNJ54BCT8374AJT | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | JT | 24 | -55°C | 125°C | 294 K |
[1] [2] [3] [4] [5] [6] 7 [8] [9] [10] |
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