| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| SN74BCT8374ADW | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
| SN74BCT8374ADWR | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
| SN74BCT8374ADWR | SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | DW | 24 | 0°C | 70°C | 294 K |
| SNJ54BCT8374AFK | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | FK | 28 | -55°C | 125°C | 294 K |
| SNJ54BCT8374AFK | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | FK | 28 | -55°C | 125°C | 294 K |
| SNJ54BCT8374AJT | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | JT | 24 | -55°C | 125°C | 294 K |
| TDA8374A/N1 | I2C-bus controlled economy PAL/NTSC and NTSC TV-processors | Philips-Semiconductors | SOT400 | - | - | - | 476 K |
| TDA8374A/N2 | I2C-bus controlled economy PAL/NTSC and NTSC TV-processors | Philips-Semiconductors | SOT400 | - | - | - | 476 K |
| TDA8374A/N3 | I2C-bus controlled economy PAL/NTSC and NTSC TV-processors | Philips-Semiconductors | SOT400 | - | - | - | 476 K |
| TDA8374AH/N3 | I2C-bus controlled economy PAL/NTSC and NTSC TV-processors | Philips-Semiconductors | SOT319 | - | - | - | 476 K |
| TDA8374AH/N3 | I2C-bus controlled economy PAL/NTSC and NTSC TV-processors | Philips-Semiconductors | SOT319 | - | - | - | 476 K |
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