Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
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85126012A | QUADRUPLE 2-INPUT POSITIVE-NOR BUFFERS WITH OPEN-COLLECTOR | Texas-Instruments | FK | 20 | -55°C | 125°C | 206 K |
CXK58512M-10LL | 65536-word x 8-bit High Speed CMOS Static RAM | Sony-Semiconductor | - | - | - | - | 210 K |
CXK58512M-55LL | 65536-word x 8-bit High Speed CMOS Static RAM | Sony-Semiconductor | - | - | - | - | 210 K |
CXK58512M-70LL | 65536-word x 8-bit High Speed CMOS Static RAM | Sony-Semiconductor | - | - | - | - | 210 K |
CXK58512TM | 65536-word x 8-bit High Speed CMOS Static RAM | Sony-Semiconductor | - | - | - | - | 210 K |
CXK5T8512TM | 65536-word x 8-bit High Speed CMOS Static RAM | Sony-Semiconductor | - | - | - | - | 216 K |
CXK5T8512TN-10LLX | 65536-word x 8-bit High Speed CMOS Static RAM | Sony-Semiconductor | - | - | - | - | 216 K |
SN74LVT18512DGGR | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | DGG | 64 | -40°C | 85°C | 544 K |
SN74LVT18512DGGR | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | DGG | 64 | -40°C | 85°C | 544 K |
SN74LVTH18512DGGR | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | Texas-Instruments | DGG | 64 | -40°C | 85°C | 518 K |
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