| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| CXP86400 | CMOS 8-bit Single Chip Microcomputer Piggyback/ evaluator type | Sony-Semiconductor | - | - | - | - | 483 K |
| SN74ABT18646PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 145 K |
| SN74ABT18646PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 145 K |
| SN74ABT18646PM | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 145 K |
| SN74ABT8646DL | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | DL | 28 | -40°C | 85°C | 388 K |
| SN74ABT8646DLR | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | DL | 28 | -40°C | 85°C | 388 K |
| SN74ABT8646DW | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | DW | 28 | -40°C | 85°C | 388 K |
| SN74ABT8646DWR | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS | Texas-Instruments | DW | 28 | -40°C | 85°C | 388 K |
| SN74ABTH18646APM | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 559 K |
| SN74LVTH18646APM | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS | Texas-Instruments | PM | 64 | -40°C | 85°C | 551 K |
| [1] [2] [3] 4 [5] [6] [7] [8] [9] [10] |
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