Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
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AD664AD-BIP | 0-7.0V; 1000mW; monolithic 12-bit quad DAC. For automatic test equipment, robotics, process control | Analog-Devices | DIP | 28 | 0°C | 70°C | 551 K |
AD664AJ | 0-7.0V; 1000mW; monolithic 12-bit quad DAC. For automatic test equipment, robotics, process control | Analog-Devices | LCC | 44 | 0°C | 70°C | 551 K |
AD664BD-BIP | 0-7.0V; 1000mW; monolithic 12-bit quad DAC. For automatic test equipment, robotics, process control | Analog-Devices | DIP | 28 | 0°C | 70°C | 551 K |
AD664BD-UNI | 0-7.0V; 1000mW; monolithic 12-bit quad DAC. For automatic test equipment, robotics, process control | Analog-Devices | DIP | 28 | 0°C | 70°C | 551 K |
AD664BE | 0-7.0V; 1000mW; monolithic 12-bit quad DAC. For automatic test equipment, robotics, process control | Analog-Devices | LCC | 44 | 0°C | 70°C | 551 K |
AD664BJ | 0-7.0V; 1000mW; monolithic 12-bit quad DAC. For automatic test equipment, robotics, process control | Analog-Devices | LCC | 44 | 0°C | 70°C | 551 K |
AD664SD-BIP | 0-7.0V; 1000mW; monolithic 12-bit quad DAC. For automatic test equipment, robotics, process control | Analog-Devices | DIP | 28 | 0°C | 70°C | 551 K |
AD664SD-UNI | 0-7.0V; 1000mW; monolithic 12-bit quad DAC. For automatic test equipment, robotics, process control | Analog-Devices | DIP | 28 | 0°C | 70°C | 551 K |
AD664TD-BIP | 0-7.0V; 1000mW; monolithic 12-bit quad DAC. For automatic test equipment, robotics, process control | Analog-Devices | DIP | 28 | 0°C | 70°C | 551 K |
AD664TD-UNI | 0-7.0V; 1000mW; monolithic 12-bit quad DAC. For automatic test equipment, robotics, process control | Analog-Devices | DIP | 28 | 0°C | 70°C | 551 K |
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