| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| DAC8408BT | 0-7V; quad 8-bit multiplying CMOS D/A converter with memory. For voltage set points in automatic test equipment | Analog-Devices | CERDIP | 28 | -55°C | 125°C | 215 K |
| DAC8408BT | 0-7V; quad 8-bit multiplying CMOS D/A converter with memory. For voltage set points in automatic test equipment | Analog-Devices | CERDIP | 28 | -55°C | 125°C | 215 K |
| DAC8408FP | 0-7V; quad 8-bit multiplying CMOS D/A converter with memory. For voltage set points in automatic test equipment | Analog-Devices | DIP | 28 | -40°C | 85°C | 215 K |
| DAC8408FPC | 0-7V; quad 8-bit multiplying CMOS D/A converter with memory. For voltage set points in automatic test equipment | Analog-Devices | PLCC | 28 | -40°C | 85°C | 215 K |
| DAC8408FS | 0-7V; quad 8-bit multiplying CMOS D/A converter with memory. For voltage set points in automatic test equipment | Analog-Devices | SOL | 28 | -40°C | 85°C | 215 K |
| DAC8408FT | 0-7V; quad 8-bit multiplying CMOS D/A converter with memory. For voltage set points in automatic test equipment | Analog-Devices | CERDIP | 28 | -40°C | 85°C | 215 K |
| DAC8412BTC/883 | 0.3-33.0V; 1000mW; quad 12-bit DAC voltage output with readback. For automatic test equipment and digitally controlled calibration. | Analog-Devices | LCC | 28 | -40°C | 85°C | 450 K |
| DAC8412EP | 0.3-33.0V; 1000mW; quad 12-bit DAC voltage output with readback. For automatic test equipment and digitally controlled calibration. | Analog-Devices | DIP | 28 | -40°C | 85°C | 450 K |
| DAC8412FP | 0.3-33.0V; 1000mW; quad 12-bit DAC voltage output with readback. For automatic test equipment and digitally controlled calibration. | Analog-Devices | DIP | 28 | -40°C | 85°C | 450 K |
| DAC8412FPC | 0.3-33.0V; 1000mW; quad 12-bit DAC voltage output with readback. For automatic test equipment and digitally controlled calibration. | Analog-Devices | PLCC | 28 | -40°C | 85°C | 450 K |
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