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DS217

Electronic component:Description:Manuf.PackagePinsT°minT°maxDatasheet
DS2172TBit Error Rate Tester (BERT)Dallas-SemiconductorTQFP320°C70°C213 K
DS2172TNBit Error Rate Tester (BERT)Dallas-SemiconductorTQFP32-40°C85°C213 K
DS2175T1/CEPT Elastic StoreDallas-SemiconductorDIP160°C70°C243 K
DS2175NT1/CEPT Elastic StoreDallas-SemiconductorDIP16-40°C85°C243 K
DS2175ST1/CEPT Elastic StoreDallas-SemiconductorSOIC160°C70°C243 K
DS2175SNT1/CEPT Elastic StoreDallas-SemiconductorSOIC16-40°C85°C243 K
DS2176NT1 Receive BufferDallas-SemiconductorDIP24-40°C85°C294 K
DS2176QT1 Receive BufferDallas-SemiconductorPLCC280°C70°C294 K
DS2176QNT1 Receive BufferDallas-SemiconductorPLCC28-40°C85°C294 K
FDS2170N3200V N-Channel PowerTrench MOSFETFairchild-Semiconductor----201 K
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