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Electronic component:Description:Manuf.PackagePinsT°minT°maxDatasheet
M54122LEarth leakage current detectorMitsubishi-Electric-Corporation-Semiconductor-Group-8-20°C80°C196 K
M54123LEarth leakage current detectorMitsubishi-Electric-Corporation-Semiconductor-Group-8-20°C80°C195 K
M54124LEarth leakage current detectorMitsubishi-Electric-Corporation-Semiconductor-Group-8-20°C80°C162 K
M54125PEarth leakage current detectorMitsubishi-Electric-Corporation-Semiconductor-GroupDIP10-20°C75°C146 K
M54128LEarth leakage current detectorMitsubishi-Electric-Corporation-Semiconductor-Group-14-20°C80°C235 K
M54133FPEarth leakage current detectorMitsubishi-Electric-Corporation-Semiconductor-GroupDIP16-20°C80°C119 K
MSM5416282-70GS-K262,144-word x 16-bit multiport DRAMdistributorSSOP640°C70°C367 K
MSM5416282-70GS-K262,144-word x 16-bit multiport DRAMdistributorSSOP640°C70°C367 K
MSM5416283-50GS-K262,144-word x 16-bit multiport DRAMdistributorSSOP640°C70°C391 K
MSM5416283-60GS-K262,144-word x 16-bit multiport DRAMdistributorSSOP640°C70°C391 K
MSM5416283-70GS-K262,144-word x 16-bit multiport DRAMdistributorSSOP640°C70°C391 K
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