| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| DS2154L | Enhanced E1 Single Chip Transceiver | Dallas-Semiconductor | LQFP | 100 | 0°C | 70°C | 1 M |
| DS2154LN | Enhanced E1 Single Chip Transceiver | Dallas-Semiconductor | LQFP | 100 | -40°C | 85°C | 1 M |
| DS2172T | Bit Error Rate Tester (BERT) | Dallas-Semiconductor | TQFP | 32 | 0°C | 70°C | 213 K |
| DS2172TN | Bit Error Rate Tester (BERT) | Dallas-Semiconductor | TQFP | 32 | -40°C | 85°C | 213 K |
| DS2175 | T1/CEPT Elastic Store | Dallas-Semiconductor | DIP | 16 | 0°C | 70°C | 243 K |
| DS2175N | T1/CEPT Elastic Store | Dallas-Semiconductor | DIP | 16 | -40°C | 85°C | 243 K |
| DS2175S | T1/CEPT Elastic Store | Dallas-Semiconductor | SOIC | 16 | 0°C | 70°C | 243 K |
| DS2175SN | T1/CEPT Elastic Store | Dallas-Semiconductor | SOIC | 16 | -40°C | 85°C | 243 K |
| DS2176N | T1 Receive Buffer | Dallas-Semiconductor | DIP | 24 | -40°C | 85°C | 294 K |
| DS2176Q | T1 Receive Buffer | Dallas-Semiconductor | PLCC | 28 | 0°C | 70°C | 294 K |
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