Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
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74ACT818CW | 8-Bit Diagnostic Register | Fairchild-Semiconductor | - | - | - | - | 55 K |
74ACT818SPC | 8-Bit Diagnostic Register | Fairchild-Semiconductor | MDIP | 24 | - | - | 55 K |
CY29FCT818ATDMB | DIAGNOSTIC SCAN REGISTER | Texas-Instruments | JT | 24 | -55°C | 125°C | 93 K |
CY29FCT818CTPC | DIAGNOSTIC SCAN REGISTER | Texas-Instruments | NT | 24 | -40°C | 85°C | 93 K |
CY29FCT818CTQC | DIAGNOSTIC SCAN REGISTER | Texas-Instruments | DBQ | 24 | -40°C | 85°C | 93 K |
CY29FCT818CTQCT | DIAGNOSTIC SCAN REGISTER | Texas-Instruments | DBQ | 24 | -40°C | 85°C | 93 K |
CY29FCT818CTSOC | DIAGNOSTIC SCAN REGISTER | Texas-Instruments | DW | 24 | -40°C | 85°C | 93 K |
CY29FCT818CTSOCT | DIAGNOSTIC SCAN REGISTER | Texas-Instruments | DW | 24 | -40°C | 85°C | 93 K |
HT818D0 | 22.4 second LOG-PCM speech | Holtek-Semiconductor-Inc- | SOP | 20 | -20°C | 70°C | 160 K |
HT818D0 | 22.4 second LOG-PCM speech | Holtek-Semiconductor-Inc- | DIP | 20 | -20°C | 70°C | 160 K |
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