| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| CD74FCT824AEN | BICMOS FCT INTERFACE LOGIC 9-BIT INVERTING D-TYPE FLIP-FLOPS WITH 3-STATE OUTPUTS | Texas-Instruments | NT | 24 | 0°C | 70°C | 39 K |
| SNJ54ABT8245FK | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 342 K |
| SNJ54ABT8245JT | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | Texas-Instruments | JT | 24 | -55°C | 125°C | 342 K |
| SNJ54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
| SNJ54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
| SNJ54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
| SNJ54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
| SNJ54BCT8240AJT | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | JT | 24 | -55°C | 125°C | 293 K |
| SNJ54BCT8244AFK | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | FK | 28 | -55°C | 125°C | 293 K |
| SNJ54BCT8244AJT | SCAN TEST DEVICES WITH OCTAL BUFFERS | Texas-Instruments | JT | 24 | -55°C | 125°C | 293 K |
| 1 [2] [3] [4] [5] [6] [7] [8] [9] |
|---|
