| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| 74ABT833D | Octal transceiver with parity generator/checker (3-State) | Philips-Semiconductors | SOT137 | - | - | - | 57 K |
| 74ABT833DB | Octal transceiver with parity generator/checker (3-State) | Philips-Semiconductors | SOT340 | - | - | - | 57 K |
| 74ABT833N | Octal transceiver with parity generator/checker (3-State) | Philips-Semiconductors | SOT222 | - | - | - | 57 K |
| 74ABT833PW | Octal transceiver with parity generator/checker (3-State) | Philips-Semiconductors | SOT355 | - | - | - | 57 K |
| SN74ABT833DW | 8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS | Texas-Instruments | DW | 24 | -40°C | 85°C | 154 K |
| SN74ABT833DW | 8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS | Texas-Instruments | DW | 24 | -40°C | 85°C | 154 K |
| SN74ABT833DW | 8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS | Texas-Instruments | DW | 24 | -40°C | 85°C | 154 K |
| SNJ54BCT8374AFK | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | FK | 28 | -55°C | 125°C | 294 K |
| SNJ54BCT8374AFK | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | FK | 28 | -55°C | 125°C | 294 K |
| SNJ54BCT8374AJT | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS | Texas-Instruments | JT | 24 | -55°C | 125°C | 294 K |
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