| Electronic component: | Description: | Manuf. | Package | Pins | T°min | T°max | Datasheet |
|---|
| AD7834AN | 0.3-7V; 450mW; LCMOS quad 14-bit DAC. For process control, automatic test equipment, general purpose instrumentation | Analog-Devices | DIP | 28 | -40°C | 85°C | 361 K |
| AD7834AR | 0.3-7V; 450mW; LCMOS quad 14-bit DAC. For process control, automatic test equipment, general purpose instrumentation | Analog-Devices | SOIC | 28 | -40°C | 85°C | 361 K |
| AD7834BR | 0.3-7V; 450mW; LCMOS quad 14-bit DAC. For process control, automatic test equipment, general purpose instrumentation | Analog-Devices | SOIC | 28 | -40°C | 85°C | 361 K |
| AD7837AN | 0.3-17V; 1000mW; LC2MOS complete, dual 12-bit MDAC. For automatic test equipment, function generation, waveform reconstruction | Analog-Devices | DIP | 24 | -40°C | 85°C | 198 K |
| AD7837AQ | 0.3-17V; 1000mW; LC2MOS complete, dual 12-bit MDAC. For automatic test equipment, function generation, waveform reconstruction | Analog-Devices | CERDIP | 24 | -40°C | 85°C | 198 K |
| AD7837AR | 0.3-17V; 1000mW; LC2MOS complete, dual 12-bit MDAC. For automatic test equipment, function generation, waveform reconstruction | Analog-Devices | SOIC | 24 | -40°C | 85°C | 198 K |
| AD7837BN | 0.3-17V; 1000mW; LC2MOS complete, dual 12-bit MDAC. For automatic test equipment, function generation, waveform reconstruction | Analog-Devices | DIP | 24 | -40°C | 85°C | 198 K |
| AD7837BQ | 0.3-17V; 1000mW; LC2MOS complete, dual 12-bit MDAC. For automatic test equipment, function generation, waveform reconstruction | Analog-Devices | CERDIP | 24 | -40°C | 85°C | 198 K |
| AD7837BR | 0.3-17V; 1000mW; LC2MOS complete, dual 12-bit MDAC. For automatic test equipment, function generation, waveform reconstruction | Analog-Devices | SOIC | 24 | -40°C | 85°C | 198 K |
| AD7837SQ | 0.3-17V; 1000mW; LC2MOS complete, dual 12-bit MDAC. For automatic test equipment, function generation, waveform reconstruction | Analog-Devices | CERDIP | 24 | -40°C | 85°C | 198 K |
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